Sem/edx company by MicroVision Laboratories? Energy Dispersive Spectroscopy (EDS) identifies the elements present in a sample by analyzing the X-rays generated by the electron beam of the Scanning Electron Microscope (SEM), making it an indispensable tool. Since X-rays are only generated from the area of the surface excited by the small electron beam, spectra of individual areas or particles can be obtained. Spectral information can therefore be generated for an entire field of view by scanning the beam, providing an elemental map. With the high count rate and excellent signal to noise ratio of our advanced QDD EDS detectors, high resolution data sets are collected and analyzed in minutes, rather than days. This elemental mapping technique allows our clients to immediately visualize the chemical landscape in their samples. Additionally, since the entire spectra is stored for each pixel, areas of interest that are identified later can be examined in detail, without ever having to re-image the sample. Other labs can’t touch the quality and visual impact of the elemental maps we produce here at MicroVision Labs. Find a few extra details at this link.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
The scan from left to right shows a high tin concentration (green line) while areas of higher lead concentrations (blue line) were not intersected by the line scan. At the interface between the tin/lead solder and copper (red line), there is a mixture of the solder and copper which is the intermetallic layer. The EDS Map provides a nice visual mixture of colors which shows the intermetallic layer while the line scan clearly shows the intermetallic with the elemental graph.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. Discover even more details on https://microvisionlabs.com/.